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Inspect F Product Data
Increase your imaging solutions with noise free, high-resolution, secondary and backscatter electron imaging• Increase your analysis capabilities, Inspect Fs high and stable probe currents at both high and low kVs are optimized for analytical capabilities such as EDS, WDS mapping...
Nanotechnology: Five myths and realities for PR professionals to consider
If you think nanotechnology is the realm of self-replicating nanobots and the green goo of science fiction,you’re not alone.This topic is ripe for clarification, and PR practitioners working in the rapidly growing world of nanoscale ideas and technologies can help foster a more accurate understan...
The Value of S/TEM: Matching Solutions, Applications, and Economics
A new generation of scanning/transmission electron microscopes (S/TEM) offers a broad range of capabilities and dramatic improvements in usability, challenging the conventional perception of these techniques as needlessly difficult and expensive. Improvements in usability address both the operati...