The FEI Strata™ family offers two DualBeam™ systems models with fast and simple high-resolution, high-contrast imaging for complete structural analysis and sample management applications. Speed your "time to answer" by performing material and defect analysis with a single tool that delivers high-resolution images and compositional data.
Advantages and Capabilities
The Strata 400 STEM [PDF 440KB] is FEI's highest resolution DualBeam™ system, and it provides the most precise and comprehensive failure analysis and characterization for labs that must address shrinking geometrics and new materials. Providing extraordinary value, it is integrated with iterative thinning and SEM-S/TEM imaging performed without breaking the vacuum, which eliminates contamination concerns while improving the lab's performance. The Strata 400 provides high-throughput cross-sectioning and automated S/TEM sample preparation using an ion column and high-performance sample stage.
Applications with Strata Family Models
The Strata family of microscopy tools are excellent performers for applications similar to the following: