Focused Ion Beam Microscopy and Micromachining
FIB instruments have both imaging and micromachining capabilities at the nanometer–micrometer scale; thus, a broad range of fundamental studies and technological applications have been enhanced or made possible with FIB technology. This following articles from the May 2007 MRS Bulletin cover the basic FIB instrument and the fundamentals of ion–solid interactions that lead to the many unique FIB capabilities as well as some of the unwanted artifacts associated with FIB instruments.
Nanotechnology: Your Guide to the future
An independent series of nanotechnology articles ranging in topics from environment to healthcare. Published in the June 2007 edition of Media Planet and distributed in the London Times. Download [PDF]
Microstructure degradation of an anode/electrolyte interface in SOFC studied by transmission electron microscopy
Using focused ion beam/lift-out (FIB/lift-out) techniques to prepare TEM specimens containing electrode/electrolyte interfaces in solid oxide fuel cells (SOFC). Download [PDF]
In-Situ Lift-Out FIB Specimen Preparation for TEM of Magnetic Materials
Using the in-situ lift-out technique to prepare specimens from magnetic materials for TEM analysis. Download [PDF]
Metallurgy and performance of electrodeposited copper for flexible circuits
The flexible printed circuits in electronic packaging are the multi-layer polymer/metal constructions, with applications in computer disc drive, printer and medical devices. Download [PDF]