register | login trouble?
  

Fundamentals of Focused Ion Beam Nanostructural Processing: Below, At, and Above the Surface

This article considers the fundamentals of what happens in a solid when it is impacted by a medium-energy gallium ion. The study of the ion/sample interaction at the nanometer scale is applicable to most focused ion beam (FIB)–based work even if the FIB/sample interaction is only a step in the pr...

To continue reading this content you must be a registered member of FEI.com.

Already a member?
Login here.

 
 

Or register today.

 
 
 
Your e-mail will be used as your login ID
 

Maybe later.

You can still stay connected with FEI by registering for our Focus Newsletter andother e-mail communications. Stay informed about FEI products, technologies, and research, along with company news, events, and the latest information from the world of microscopy and nanotechnology.