Become a Member - FEI NanoCenter

In-Situ Lift-Out FIB Specimen Preparation for TEM of Magnetic Materials

The focused ion beam (FIB) (ex-situ) lift-out technique has been used to prepare specimens for transmission electron microscopy (TEM) from numerous materials applications [1]. In this report, we use the in-situ lift-out technique [2] to prepare specimens from magnetic materials for TEM analysis. ...

To continue reading this content you must be a registered member of FEI.com.

Already a member?
Login here.

Username:
Password:

forgot password

Or register today.

Learn more about the benefits of membership

*First Name:

*Last Name:

*E-mail address:

Your e-mail will be used as your login ID

Do you currently own or use any FEI equipment?

Maybe later.

You can still stay connected with FEI by registering for our Focus Newsletter andother e-mail communications. Stay informed about FEI products, technologies, and research, along with company news, events, and the latest information from the world of microscopy and nanotechnology.

Subscribe to FEI Focus

No thanks. Take me back to where I was.

In-Situ Lift-Out FIB Specimen Preparation for TEM of Magnetic Materials

Already a member? Login here.

Or register today.

Maybe later.

Already a member?
Login here.